Advanced mathematical and computational tools in metrology and testing X [electronic resource]

• 其他作者：
  • Pavese, Franco.
• 其他題名：
  • Series on advances in mathematics for applied sciences ;
• 出版： Singapore : World Scientific
• 版本：1st ed.
• 叢書名： Series on advances in mathematics for applied sciences ;v. 86
• 主題： Metrology. , Statistics.
• ISBN： 9789814678629 (electronic bk.)
• FIND@SFXID: CGU
• 資料類型: 電子書
• 內容註: Includes bibliographical references and indexes. Title from PDF title page (viewed June 15, 2015)
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• 摘要註: "This volume contains original and refereed contributions from the tenth AMCTM Conference (http://www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards."--Provided by publisher.
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