Nanocharacterization techniques

• 其他作者：
  • Roz, Alessandra Luzia da, editor.
  • Ferreira, Marystela, editor.
  • Leite, Fabio de Lima, editor.
  • Oliveira, Osvaldo N., Jr., editor.
• 出版： Oxford : William Andrew, imprint of Elsevier
• 叢書名： Micro and nano technologies series
• 主題： Nanostructured materials. , Nanotechnology--Research.
• ISBN： 9780323497787 (hbk.): US$121.98 、 0323497780 (hbk)
• 資料類型: 圖書
• 內容註: Includes bibliographical references and index. Scanning electron microscopy / Marcelo de Assumpocao Pereira-da-Silva, FAbio A. Ferri -- Atomic force microscopy: a powerful tool for electrical characterization / Ronald Taram, Pamela S. Garcia, Daiana K. Deda, Jose A. Varela, Fabio de Lima Leite -- Spectroscopic techniques for characterization of nanomaterials / Priscila Alessio, Pedro H. B. Aoki, Leonardo N. Furini, Alvaro E. Aligag, Carlos J. Leopoldo Constantino -- Dynamic light scattering applied to nanoparticle characterization / Ana P. Ramos -- X-ray diffraction and scattering by nanomaterials / Diego G. Lamas, Mario de Oliveira Neto, Guinther Kellermann, Aldo F. Craievich -- Surface plasmon resonance (SPR) for sensors and biosensors / Celina M. Miyaszaki, Flavio M. Schimizu, Marystela Ferreira.
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• 摘要註: This book covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail.
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