Quantum metrology, imaging, and communication

• 作者： Simon, David S., author.
• 其他作者：
  • Jaeger, Gregg, author.
  • Sergienko, Alexander V., author.
  • SpringerLink (Online service)
• 其他題名：
  • Quantum science and technology.
• 出版： Cham : Springer International Publishing :Imprint: Springer
• 叢書名： Quantum science and technology,
• 主題： Quantum theory. , Quantum computing. , Physics. , Quantum Optics. , Quantum Information Technology, Spintronics. , Quantum Physics.
• ISBN： 9783319465517 (electronic bk.) 、 9783319465494 (paper)
• FIND@SFXID: CGU
• 資料類型: 電子書
• 內容註: Quantum Optics and Entanglement -- Two-Photon Interference- Aberration and Dispersion Cancelation -- Quantum Metrology -- Polarization Mode Dispersion -- Ghost Imaging and Related Topics -- Quantum Microscopy -- Correlated and Entangled Orbital Angular Momentum -- Quantum Communication and Cryptography -- Appendices A: Review of Optics -- B: Optical Fields in Quantum Mechanics -- C: Optical Effects of Aberration and Turbulence -- D: Phase Matching in Spontaneous Parametric Down Conversion -- E: Vectorial Scattering Analysis of the Twin-Photon Microscope.
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• 摘要註: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
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