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Metrology and physical mechanisms in new generation ionic devices
- 作者： Celano, Umberto, author.
- 其他作者：
- 其他題名：
- Springer theses.
- 出版： Cham : Springer International Publishing :Imprint: Springer
- 叢書名： Springer theses,
- 主題： Thin films. , Electronic apparatus and appliances. , Metrology. , Nonvolatile random-access memory. , Physics. , Spectroscopy and Microscopy. , Nanotechnology and Microengineering. , Characterization and Evaluation of Materials.
- ISBN： 9783319395319 (electronic bk.) 、 9783319395302 (paper)
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FIND@SFXID:
CGU
- 資料類型: 電子書
- 內容註: Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook.
- 摘要註: The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
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讀者標籤：
- 系統號： 005363962 | 機讀編目格式
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