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Stress-induced phenomena in metallization : third international workshop, Palo Alto, CA June 1995
- 作者: Ho, P. S.
- 其他題名:
- AIP conference proceedings ;
- 出版: New York : American Institute of Physics
- 叢書名: AIP conference proceedings ;no. 373
- 主題: Semiconductors--Defects--Congresses , Metallic films--Congresses , Thin film devices--Defects--Congresses , Aluminum films--Congresses
- ISBN: 1563964392 :: US$140.00
- 資料類型: 圖書
- 內容註: Includes bibliographical references and index "DOE CONF-9506336"--T.p. verso
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讀者標籤:
- 系統號: 005199617 | 機讀編目格式