Magnetic microscopy of layered structures [electronic resource]

• 其他作者：
  • Kuch, Wolfgang.
  • SpringerLink (Online service)
• 其他題名：
  • Springer Series in Surface Sciences,
• 出版： Berlin, Heidelberg : Springer Berlin Heidelberg :Imprint: Springer
• 叢書名： Springer Series in Surface Sciences,v.57
• 主題： Microscopy--Technique. , Physics , Magnetism, Magnetic Materials. , Characterization and Evaluation of Materials. , Surfaces and Interfaces, Thin Films. , Engineering, general.
• ISBN： 9783662445327 (electronic bk.) 、 9783662445310 (paper)
• FIND@SFXID: CGU
• 資料類型: 電子書
• 內容註: Photoelectron Emission Microscopy Using X-Ray Circular Magnetic Dichroism -- Imaging Antiferromagnetic Domains by Photoelectron Emission Microscopy -- Transmission X-Ray Microscopy for the Element-Resolved Imaging of Magnetic Domains -- Layer-Sensitive Magneto-Optical Kerr Effect Microscopy.
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• 摘要註: This book presents the important analytical technique of magnetic microscopy. This method is applied to analyze layered structures with high resolution. This book presents a number of layer-resolving magnetic imaging techniques that have evolved recently. Many exciting new developments in magnetism rely on the ability to independently control the magnetization in two or more magnetic layers in micro- or nanostructures. This in turn requires techniques with the appropriate spatial resolution and magnetic sensitivity. The book begins with an introductory overview, explains then the principles of the various techniques and gives guidance to their use. Selected examples demonstrate the specific strengths of each method. Thus the book is a valuable resource for all scientists and practitioners investigating and applying magnetic layered structures.
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