Radiation-tolerant delta-sigma time-to-digital converters [electronic resource]

• 作者： Cao, Ying.
• 其他作者：
  • Leroux, Paul.
  • Steyaert, Michiel.
  • SpringerLink (Online service)
• 其他題名：
  • Analog Circuits and Signal Processing Series
• 出版： Cham : Springer International Publishing :Imprint: Springer
• 叢書名： Analog Circuits and Signal Processing Series
• 主題： Metal oxide semiconductors, Complementary , Integrated circuits--Effect of radiation on. , Analog-to-digital converters , Engineering , Circuits and Systems. , Electronic Circuits and Devices. , Electronics and Microelectronics, Instrumentation.
• ISBN： 9783319118420 (electronic bk.) 、 9783319118413 (paper)
• FIND@SFXID: CGU
• 資料類型: 電子書
• 內容註: Introduction -- Background on Time-to-Digital Converters -- Radiation-Hardened-by-Design -- The MASH DS Time-to-Digital Converter -- Radiation Hardened Bandgap References -- Low-Jitter Relaxation Oscillators -- Conclusions.
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• 摘要註: This book focuses on the design of a Mega-Gray (a standard unit of total ionizing radiation) radiation-tolerant ps-resolution time-to-digital converter (TDC) for a light detection and ranging (LIDAR) system used in a gamma-radiation environment. Several radiation-hardened-by-design (RHBD) techniques are demonstrated throughout the design of the TDC and other circuit techniques to improve the TDC's resolution in a harsh environment are also investigated. Readers can learn from scratch how to design a radiation-tolerant IC. Information regarding radiation effects, radiation-hardened design techniques and measurements are organized in such a way that readers can easily gain a thorough understanding of the topic. Readers will also learn the design theory behind the newly proposed delta-sigma TDC. Readers can quickly acquire knowledge about the design of radiation-hardened bandgap voltage references and low-jitter relaxation oscillators, which are introduced in the content from a designer's perspective. Discusses important aspects of radiation-tolerant analog IC design, including realistic applications and radiation effects on ICs; Demonstrates radiation-hardened-by-design techniques through a design-test-radiation assessment practice; Describes a new type of Time-to-Digital (TDC) converter designed for radiation-tolerant application; Explains the design and measurement of all functional blocks (e.g., bandgap reference, relaxation oscillator) in the TDC.
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