An introduction to mixed-signal IC test and measurement

• 作者： Roberts, Gordon W., 1959-
• 其他作者：
  • Taenzler, Friedrich.
  • Burns, Mark, 1962-
• 其他題名：
  • Oxford series in electrical and computer engineering.
• 出版： New York : Oxford University Press
• 版本：2nd ed.
• 叢書名： The Oxford series in electrical and computer engineering
• 主題： Integrated circuits--Testing , Mixed signal circuits--Testing
• ISBN： 9780199796212 (hbk.): US$147.2 、 0199796211 (hbk.)
• 資料類型: 圖書
• 內容註: Includes bibliographical references and index. Overview of mixed-signal testing -- Tester hardware -- DC and parametric measurements -- Data analysis and probability theory -- Yield, measurement accuracy, and test time -- DAC testing -- ADC testing -- Sampling theory -- DSP-based testing -- Analog channel testing -- Sampled channel testing -- Fundamentals of RF testing -- RF test methods -- Clock and serial data communications channel measurements -- Tester interfacing--DIB design -- Design for test (DfT). Burns' name appears first on the previous edition.
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• 摘要註: "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher.
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