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Thermal reliability of power semiconductor device in the renewable energy system [electronic resource]
- 作者： Du, Xiong.
- 其他作者：
- 其他題名：
- CPSS power electronics series.
- 出版： Singapore : Springer Nature Singapore :Imprint: Springer
- 叢書名： CPSS power electronics series,
- 主題： Power semiconductors. , Renewable energy sources. , Electrical Power Engineering. , Electronic Circuits and Systems. , Energy Grids and Networks. , Electronics and Microelectronics, Instrumentation.
- ISBN： 9789811931321 (electronic bk.) 、 9789811931314 (paper)
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FIND@SFXID:
CGU
- 資料類型: 電子書
- 內容註: Introduction -- Thermal fatigue failure mechanism of power devices in renewable energy system -- Thermal model and thermal parameters monitoring -- Thermal analysis of power semiconductor device in renewable energy system -- Multi-time scale lifetime evaluation for the device in the renewable application -- Thermal management design and optimization -- Prospect.
- 摘要註: This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
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讀者標籤：
- 系統號： 005516296 | 機讀編目格式
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