Reliability analysis and plans for successive testing start-up demonstration tests and applications / [electronic resource] :

• 作者： Balakrishnan, N., 1956- author.
• 其他作者：
  • Koutras, Markos V., author.
  • Milienos, Fotios, author.
• 出版： London ;Cambridge, MA : Academic Press
• 主題： Reliability (Engineering) , Fiabilite. , Reliability (Engineering) , Electronic books.
• ISBN： 0128043628 (electronic bk.) 、 9780128043622 (electronic bk.)
• FIND@SFXID: CGU
• 資料類型: 電子書
• More
• 摘要註: Reliability Analysis and Plans for Successive Testing: Start-up Demonstration Tests and Applications discusses all past and recent developments on start-up demonstration tests in the context of current numerical and illustrative examples to clarify available methods for distribution theorists and applied mathematicians dealing with control problems. Throughout the book, the authors focus on the panorama of open problems and issues of further interest. As contemporary manufacturers face tremendous commercial pressures to assemble works of high reliability, defined as 'the probability of the product performing its role under the stated conditions and over a specified period of time', this book helps address testing issues.
• 讀者標籤：

  需登入
• 引用連結：

  Copy Link
• 目前引用數
• Share: