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Lock-in thermography basics and use for evaluating electronic devices and materials / [electronic resource] :
- 作者: Breitenstein, Otwin.
- 其他作者:
- 出版: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg
- 版本:2nd ed.
- 叢書名: Springer series in advanced microelectronics ;10
- 主題: Electronic apparatus and appliances--Thermal properties , Electronic apparatus and appliances--Testing , Semiconductors--Thermal properties , Thermography , Physics , Optics, Optoelectronics, Plasmonics and Optical Devices. , Characterization and Evaluation of Materials. , Engineering, general. , Structural Materials.
- ISBN: 9783642024177 (electronic bk.) 、 9783642024160 (paper)
- FIND@SFXID: CGU
- 資料類型: 電子書
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讀者標籤:
- 系統號: 005064783 | 機讀編目格式