Accelerated testing statistical models, test plans and data analyses / [electronic resource] :

• 作者： Nelson, Wayne, 1936-
• 出版： New York : Wiley
• 主題： Failure time data analysis. , Reliability (Engineering)--Statistical methods. , Accelerated life testing--Statistical methods. , Temps entre defaillances, Analyse des. , Fiabilite--Methodes statistiques. , Essais acceleres (Technologie)--Methodes statistiques. , Levensduur. , Statistische analyse. , Signifikanztest , Engineering Mathematical models , Electronic books.
• ISBN： 9780470317471 (electronic bk.) 、 0470317477 (electronic bk.) 、 9780470316795 、 0470316799
• FIND@SFXID: CGU
• 資料類型: 電子書
• 內容註: Includes bibliographical references (pages 561-577). Accelerated Testing Statistical Models, Test Plans, and Data Analyses; Contents; Preface; 1. Introduction and Background; 2. Models for Life Tests with Constant Stress; 3. Graphical Data Analysis; 4. Complete Data and Least Squares Analyses; 5. Censored Data and Maximum Ukelihood Methods; 6. Test Plans; 7. Competing Failure Modes and Size Effect; 8. Least-Squares Comparisons for Complete Data; 9. Maximum Likelihood Comparisons for Censored and Other Data; 10. Models and Data Analyses for Step and Varying Stress; 11. Accelerated Degradation; Appendix A. Statistical Tables; References; Index.
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• 摘要註: Useful methodology has been developed in accelerated testing. This work deals with the topic Accelerated Testing: Statistical Models, Test Plans, and Data Analyses. It is useful for practitioners.
• 語文註：English.
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