Lock-in thermography : basics and use for evaluating electronic devices and materials

• 作者： Breitenstein, Otwin, author.
• 其他作者：
  • Warta, Wilhelm, author.
  • Schubert, Martin C., author.
  • SpringerLink (Online service)
• 其他題名：
  • Springer series in advanced microelectronics ;
• 出版： Cham : Springer International Publishing :Imprint: Springer
• 版本：Thrid edition.
• 叢書名： Springer series in advanced microelectronics,volume 10
• 主題： Electronic apparatus and appliances--Thermal properties. , Electronic apparatus and appliances--Testing. , Semiconductors--Thermal properties. , Thermography. , Optics, Lasers, Photonics, Optical Devices. , Characterization and Evaluation of Materials. , Microwaves, RF and Optical Engineering. , Structural Materials.
• ISBN： 9783319998251 (electronic bk.) 、 9783319998244 (paper)
• FIND@SFXID: CGU
• 資料類型: 電子書
• 內容註: Introduction -- Physical and Technical Basics -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
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• 摘要註: This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
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